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Optical imaging through scattering media has long been a challenge. Many approaches have been developed for focusing light or imaging objects through scattering media, but usually, they are either invasive, limited to stationary or slow-moving media, or require high-resolution cameras and complex algorithms to retrieve the images. By utilizing spatial–temporal encoded patterns (STEPs), we introduce a technique for the computation of imaging that overcomes these restrictions. With a single-pixel photodetector, we demonstrate non-invasive imaging through scattering media. This technique is insensitive to the motion of the media. Furthermore, we demonstrate that our image reconstruction algorithm is much more efficient than correlation-based algorithms for single-pixel imaging, which may allow fast imaging for applications with limited computing resources.

 

We propose and demonstrate a method for measuring the time evolution of the off-diagonal elements ρ n,n + k ( t ) of the reduced density matrix obtained from the quantum theory of the laser. The decay rates of the off-diagonal matrix element ρ n,n + k ( t ) (k = 2,3) are measured for the first time and compared with that of ρ n,n +1 ( t ), which corresponds to the linewidth of the laser. The experimental results agree with the Scully-Lamb quantum theory of the laser. 

We present a novel method, to our knowledge, to synthesize non-trivial speckle patterns that can enable sub-Rayleigh second-order correlation imaging. The speckle patterns acquire a unique anti-correlation in the spatial intensity fluctuation by introducing the blue noise distribution on spatial Fourier power spectrum to the input light fields through amplitude modulation. Illuminating objects with the blue noise speckle patterns can lead to a sub-diffraction limit imaging system with a resolution more than three times higher than first-order imaging, which is comparable to the resolving power of ninth order correlation imaging with thermal light. Our method opens a new route towards non-trivial speckle pattern generation by tailoring amplitudes in spatial Fourier power spectrum of the input light fields and provides a versatile scheme for constructing sub-Rayleigh imaging and microscopy systems without invoking complicated higher-order correlations.

 

Driving solutions for power semiconductor devices are experiencing new challenges since the emerging wide bandgap power devices, such as silicon carbide (SiC), with superior performance become commercially available. Generally, high switching speed is desired due to the lower switching loss, yet high dv/dt and di/dt can result in elevated electromagnetic interference (EMI) emission, false-triggering, and other detrimental effects during switching transients. Active gate drivers (AGDs) have been proposed to balance the switching losses and the switching speed of each switching transient. The review of the in-existence AGD methodologies for SiC devices has not been reported yet. This review starts with the essence of the slew rate control and its significance. Then a comprehensive review categorizing the state-of-the-art AGD methodologies is presented. It is followed by a summary of the AGDs control and timing strategies. In this work, using AGD to reduce the EMI noise of a 10 kV SiC MOSFET system is reported. This work also highlights other capabilities of AGDs including reliability enhancement of power devices and rebalancing the mismatched electrical parameters of parallel- and series-connected devices. These application scenarios of AGDs are validated via simulation and experimental results.